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Correlative Analysis using FIB-ToF-SIMS and Atom Probe Tomography on Geological Materials

Published online by Cambridge University Press:  25 July 2016

William D.A. Rickard ,
Steven M. Reddy ,
David W. Saxey ,
Denis Fourgerouse  and
Arie van Riessen
William D.A. Rickard
Affiliation:
Geoscience Atom Probe, Advanced Resource Characterisation Facility & John de Laeter Centre, Curtin University, Perth, Australia Department of Physics and Astronomy, Curtin University, Perth, Australia
Steven M. Reddy
Affiliation:
Geoscience Atom Probe, Advanced Resource Characterisation Facility & John de Laeter Centre, Curtin University, Perth, Australia Department of Applied Geology, Curtin University, Perth, Australia
David W. Saxey
Affiliation:
Geoscience Atom Probe, Advanced Resource Characterisation Facility & John de Laeter Centre, Curtin University, Perth, Australia Department of Physics and Astronomy, Curtin University, Perth, Australia
Denis Fourgerouse
Affiliation:
Geoscience Atom Probe, Advanced Resource Characterisation Facility & John de Laeter Centre, Curtin University, Perth, Australia Department of Applied Geology, Curtin University, Perth, Australia
Arie van Riessen
Affiliation:
Geoscience Atom Probe, Advanced Resource Characterisation Facility & John de Laeter Centre, Curtin University, Perth, Australia Department of Physics and Astronomy, Curtin University, Perth, Australia

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 684 - 685
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Valley, J, et al, Nature Geoscience 7 (2014). p. 219–223.Google Scholar
[2] Piazolo, S, et al, Nature Communication 7 (2016). p. 1–7.Google Scholar
[3] Alberts, D, et al, Instrumentation Science & Technology 42 (2014). p. 432–445.Google Scholar