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Correlative 3D Characterization of High Temperature Oxide Scales on Co-Base Superalloys Using Nano-CT and FIB/SEM Tomography

Published online by Cambridge University Press:  05 August 2019

Janis Wirth*
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander University Erlangen-Nuremberg, Germany.
Malte Lenz
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander University Erlangen-Nuremberg, Germany.
Silvan Englisch
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander University Erlangen-Nuremberg, Germany.
Jan Rosiwal
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander University Erlangen-Nuremberg, Germany.
Nadine Buchinger
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander University Erlangen-Nuremberg, Germany.
Martin Weiser
Affiliation:
Chair for Surface Science and Corrosion, Friedrich-Alexander University Erlangen-Nuremberg, Germany.
Benjamin Apeleo Zubiri
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander University Erlangen-Nuremberg, Germany.
Sannakaisa Virtanen
Affiliation:
Chair for Surface Science and Corrosion, Friedrich-Alexander University Erlangen-Nuremberg, Germany.
Erdmann Spiecker*
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander University Erlangen-Nuremberg, Germany.
*
*Corresponding authors: [email protected], [email protected]
*Corresponding authors: [email protected], [email protected]

Abstract

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Type
Leveraging 3D Imaging and Analysis Methods for New Opportunities in Material Science
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Weiser, M et al. , Corr. Sci. 135 (2018), p. 78.Google Scholar
[2]Volz, N et al. , Met. Mat. Trans. A 49 (2018), p. 4099.Google Scholar
[3]Tkachuk, A et al. , Z. Kristallogr. 222 (2007), p. 650.Google Scholar
[4]The authors acknowledge the financial support of the DFG within the frameworks of the collaborative research center SFB/TR 103 (projects A7 and A5) and the project SP648/8 “High-resolution X-ray microscopy for correlative tomography, high throughput screening and in situ mechanical testing of structural and functional materials”.Google Scholar