Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-25T08:29:35.899Z Has data issue: false hasContentIssue false
  • English
  • Français

Correlation Averaging of Single-Atomic-Column STEM-EDX Images for Sub-Atomic Information

Published online by Cambridge University Press:  25 July 2016

Jong Seok Jeong  and
K. Andre Mkhoyan
Jong Seok Jeong
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, United States
K. Andre Mkhoyan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 882 - 883
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Muller, DA, et al, Science 319 (2008). p. 1073.Google Scholar
[2] D’Alfonso, AJ, et al, Phys. Rev. B 81 (2010). p. 100101.Google Scholar
[3] Suenaga, K, et al, Nat. Photon 6 (2012). p. 545.Google Scholar
[4] Neish, MJ, et al, Phys. Rev. B 88 (2013). p. 115120.CrossRefGoogle Scholar
[5] Kothleitner, G, et al, Phys. Rev. Lett 112 (2014). p. 085501.CrossRefGoogle Scholar
[6] Lugg, NR, et al, Microsc. Microanal 20 (2014). p. 1078.Google Scholar
[7] This work was supported by NSF MRSEC under award DMR-1420013. STEM analysis was carried out in the Characterization Facility of the University of Minnesota, which receives partial support from the NSF through the MRSEC program.Google Scholar