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Correlated Electron Microscopy across Length Scales to Elucidate Structural, Electrical and Chemical Properties of Oxide Grain Boundaries

Published online by Cambridge University Press:  04 August 2017

William J. Bowman ,
Madeleine N. Kelly ,
Gregory S. Rohrer ,
Cruz A. Hernandez ,
Amith Darbal  and
Peter A. Crozier
William J. Bowman
Affiliation:
School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ, USA Laboratory for Electrochemical Interfaces, MIT, Cambridge, MA, US
Madeleine N. Kelly
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA, USA
Gregory S. Rohrer
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA, USA
Cruz A. Hernandez
Affiliation:
School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ, USA
Amith Darbal
Affiliation:
AppFive LLC, Tempe, AZ, USA
Peter A. Crozier
Affiliation:
School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 334 - 335
Copyright
© Microscopy Society of America 2017 

References

[1] Guo, X. & Waser, R. Prog. Mater. Sci 51 2006 151–206.CrossRefGoogle Scholar
[2] Jasper, A., Kilner, J.A. & McComb, D.W. Solid State Ion 179 2008 904–908.CrossRefGoogle Scholar
[3] Bowman, W.J., Kelly, M.N., Rohrer, G.S., Hernandez, C.A. & Crozier, P.A. (In review).Google Scholar
[4] Bowman, W.J., Darbal, A. & Crozier, P.A. (In preparation).Google Scholar
[5] W.J.B. acknowledges the NSF’s Graduate Research Fellowship (DGE-1211230) for financial support. M.N.K. and G.S.R. acknowledge support from the ONR-MURI program (grant no. N00014-11 -0678). C.A.H. acknowledges ASU’s Fulton Undergraduate Research Initiative for financial support. P.A.C. and W.J.B. acknowledge support of NSF grant DMR-1308085. The authors acknowledge access to ASU’s John M. Cowley Center for High Resolution Electron Microscopy..Google Scholar