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Contributions of Inelastically Scattered Electrons to Defect Images

Published online by Cambridge University Press:  01 August 2002

M. A. Kirk ,
R. Twesten ,
S. P. Martin ,
C. J. D. Hetherington  and
M. L. Jenkins
M. A. Kirk
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
R. Twesten
Affiliation:
Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign
S. P. Martin
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
C. J. D. Hetherington
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
M. L. Jenkins
Affiliation:
Department of Materials, University of Oxford, Oxford, UK

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 622 - 623
Copyright
Copyright © Microscopy Society of America 2002