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Continuous Wavelet Transforms for Measuring Roughness of Nanoscale Interfaces

Published online by Cambridge University Press:  01 August 2018

Darren Homeniuk ,
Marek Malac  and
Misa Hayashida
Darren Homeniuk
Affiliation:
Nanotechnology Research Center, 11421 Saskatchewan Drive, T6G 2M9, Edmonton, Alberta, Canada
Marek Malac
Affiliation:
Nanotechnology Research Center, 11421 Saskatchewan Drive, T6G 2M9, Edmonton, Alberta, Canada Department of Physics, University of Alberta, T6G 2E1, Edmonton, Alberta, Canada
Misa Hayashida
Affiliation:
Nanotechnology Research Center, 11421 Saskatchewan Drive, T6G 2M9, Edmonton, Alberta, Canada

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1048 - 1049
Copyright
© Microscopy Society of America 2018 

References

[1] Grier, A., et al, Journal of Applied Physics 118 2015) p. 224308.Google Scholar
[2] Hayashida, M., et al, JVST B 33 2015) p. 040605.Google Scholar
[3] Malac, M., et al, Nano Testing Symposium 2017) p. 247–250.Google Scholar
[4] Addison, P. in The Illustrated Wavelet Transform Handbook (2nd ed. CRC Press London p. 7–92.Google Scholar
[5] Lilly, J. Olhede, S. IEEE Transactions on Signal Processing 60 2012) p. 6036–6040.Google Scholar