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Computer Simulation Applied to WD Analysis

Published online by Cambridge University Press:  02 July 2020

S J.B. Reed  and
A. Buckley
S J.B. Reed
Affiliation:
Department of Earth Sciences, University of Cambridge, Cambridge, CB2 3EQ, England
A. Buckley
Affiliation:
Department of Earth Sciences, University of Cambridge, Cambridge, CB2 3EQ, England
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Extract

The efficiency and reliability of WD analysis can be enhanced substantially by means of computer simulation carried out before embarking on the actual analysis, thereby eliminating the need for a time-wasting ‘trial and error’ process and preventing errors in quantitative analysis due to line overlaps etc. which otherwise might be undetected. By displaying on-screen the combined spectra of elements known or expected to be present in a given sample, overlaps can be studied in detail, which may indicate the preferability of using an alternative analytical peak (e.g. L(Lβ1 instead of Lα1). The selection of optimum background positions with minimal overlap from neighbouring elements is also facilitated. These choices can be made much more rapidly and reliably than by depending on wavelength tables, while also saving the considerable instrument time required to carry out wavelength scans for each new type of sample.

Type
Problem Elements and Spectrometry Problems in X-Ray Microanalysis
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 236 - 237
Copyright
Copyright © Microscopy Society of America

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References

1.Fiori, C.E. and Swyt, C.R., U.S. patent no. 5299138 (1994).Google Scholar
2.Reed, S.J.B. and Buckley, A., Mikrochim. Acta [suppl.] 13 (1996) 479.Google Scholar
3. For details see: http://www.esc.cam.ac.uk/astafFbuckley/vwdsl.htmlGoogle Scholar
4.Reed, S.J.B. and Buckley, A., Mineral. Mag., in press.Google Scholar