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A Computer Program for Objective Point Symmetry Classifications of Electron Diffraction Spot Patterns with Apparent Hexagonal or Rectangular-Centered Lattice Metric
Published online by Cambridge University Press: 22 July 2022
Abstract
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- Type
- Microcrystal Electron Diffraction (MicroED)
- Information
- Copyright
- Copyright © Microscopy Society of America 2022
References
Moeck, P, Acta Cryst. A, vol. 78, 2022, in print, 23 pages, doi: 10.1107/S2053273322000845, (expanded version, 35 pages, arXiv: 2108.00829, Jan. 4, 2022).CrossRefGoogle Scholar
Moeck, P in “Microscopy and Imaging Science: Practical Approaches to Applied Research and Education”, ed. Méndez-Villas, A., (Badajoz: FORMATEX, 2017) p. 503; arXiv: 2011.13102v2.Google Scholar
Zou, X, Hovmöller, S, and Oleynikov, P, Electron Crystallography: Electron Microscopy and Electron Diffraction, (Oxford University Press, 2011).Google Scholar
Anderson, D. R., Model Based Inference in the Life Sciences: A Primer on Evidence, New York, NY: Springer Science+Business Media, 2008.CrossRefGoogle Scholar
This work was supported by a Faculty Enhancement Grant from Portland State University to the second (and corresponding) author. The described computer program can be obtained from the first author on request.Google Scholar
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