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A Computer Program for Objective Point Symmetry Classifications of Electron Diffraction Spot Patterns with Apparent Hexagonal or Rectangular-Centered Lattice Metric
Published online by Cambridge University Press:
22 July 2022
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Moeck, P in “Microscopy and Imaging Science: Practical Approaches to Applied Research and Education”, ed. Méndez-Villas, A., (Badajoz: FORMATEX, 2017) p. 503; arXiv: 2011.13102v2.Google Scholar
[5]
Zou, X, Hovmöller, S, and Oleynikov, P, Electron Crystallography: Electron Microscopy and Electron Diffraction, (Oxford University Press, 2011).Google Scholar
[6]
Moeck, P and von Koch, L, arXiv: 2201.04789, 4 pages, Jan.-Feb. 2022.Google Scholar
[7]
Moeck, P and von Koch, L, arXiv: 2202.00220, 4 pages, Feb. 2022.Google Scholar
[8]
Anderson, D. R., Model Based Inference in the Life Sciences: A Primer on Evidence, New York, NY: Springer Science+Business Media, 2008.CrossRefGoogle Scholar
[9]
This work was supported by a Faculty Enhancement Grant from Portland State University to the second (and corresponding) author. The described computer program can be obtained from the first author on request.Google Scholar