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Computationally Assisted STEM and EXAFS Characterization of Tunable Rh/Au and Rh/Ag Bimetallic Nanoparticle Catalysts

Published online by Cambridge University Press:  04 August 2017

Stephen D. House
Affiliation:
Dept. of Chemical and Petroleum Engineering, University of Pittsburgh, Pittsburgh, PA(USA)
Cecile S. Bonifacio
Affiliation:
Dept. of Chemical and Petroleum Engineering, University of Pittsburgh, Pittsburgh, PA(USA)
Janis Timoshenko
Affiliation:
Dept. of Materials Science and Chemical Eng., Stony Brook University, Stony Brook, NY(USA)
Pranaw Kunal
Affiliation:
Dept. of Chemistry, The University of Texas at Austin, Austin, TX(USA)
Haiqin Wan
Affiliation:
Dept. of Chemistry, The University of Texas at Austin, Austin, TX(USA)
Zhiyao Duan
Affiliation:
Dept. of Chemistry, The University of Texas at Austin, Austin, TX(USA)
Hao Li
Affiliation:
Dept. of Chemistry, The University of Texas at Austin, Austin, TX(USA)
Judith C. Yang
Affiliation:
Dept. of Chemical and Petroleum Engineering, University of Pittsburgh, Pittsburgh, PA(USA)
Anatoly I. Frenkel
Affiliation:
Dept. of Materials Science and Chemical Eng., Stony Brook University, Stony Brook, NY(USA) Chemistry Division, Brookhaven National Laboratory, Upton, NY(USA)
Simon M. Humphrey
Affiliation:
Dept. of Chemistry, The University of Texas at Austin, Austin, TX(USA)
Richard M. Crooks
Affiliation:
Dept. of Chemistry, The University of Texas at Austin, Austin, TX(USA)
Graeme A. Henkelman
Affiliation:
Dept. of Chemistry, The University of Texas at Austin, Austin, TX(USA)

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Singh, A.K. & Xu, Q. ChemCatChem 5 2013). p 47544766.Google Scholar
[2] Ferrando, R., Jellinek, J. & Johnston, R.L. Chem. Rev. 108 2008). p 845910.Google Scholar
[3] Frenkel, A.I. Chem. Soc. Rev 41 2012). p 81638178.Google Scholar
[4] Yang, J.C., et al, Chem. Soc. Rev 41 2012). p 81798194.Google Scholar
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[6] This work was supported by NSF DMREF through contract No CHE-1534630. The authors would like to acknowledge FEI Company for additional microscopy work.Google Scholar