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Compositional Averaging of Backscatter Intensities in Compounds

Published online by Cambridge University Press:  23 May 2003

John J. Donovan
Affiliation:
Department of Geological Sciences, The University of Oregon, Eugene, Oregon 97403-1272, USA
Nicholas E. Pingitore
Affiliation:
Department of Geological Sciences, The University of Texas at El Paso, El Paso, Texas 79968-0555, USA
Andrew Westphal
Affiliation:
Department of Physics, The University of California, Berkeley, California 94720, USA
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Abstract

We present high-precision measurements of pure element stable isotope pairs that demonstrate mass has no influence on the backscattering of electrons at typical electron microprobe energies. The traditional prediction of average backscatter intensities in compounds was pragmatically based on elemental mass fractions. Our isotopic measurements establish that this approximation has no physical basis. We propose an alternative model to mass fraction averaging, based on the number of electrons or protons, termed “electron fraction,” which predicts backscatter yield better than mass fraction averaging. We also present an improved backscatter (electron loss) factor based on a modified electron fraction average for the ZAF atomic number correction that provides a significant analytical improvement, especially where large atomic number corrections are required.

Type
Research Article
Copyright
2003 Microscopy Society of America

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