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Comparison of SCEM and STEM-HAADF Imaging in Thick Specimens

Published online by Cambridge University Press:  01 August 2005

N J Zaluzec  and
J Hiller
N J Zaluzec
Affiliation:
Argonne National Laboratory, Argonne, Illinois
J Hiller
Affiliation:
Argonne National Laboratory, Argonne, Illinois

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 714 - 715
Copyright
© 2005 Microscopy Society of America