Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-28T12:59:01.874Z Has data issue: false hasContentIssue false
  • English
  • Français

A Comparison of Ga FIB and Xe-Plasma FIB of Complex Al Alloys

Published online by Cambridge University Press:  04 August 2017

Alexis Ernst ,
Mei Wei  and
Mark Aindow
Alexis Ernst
Affiliation:
Institute of Materials Science, University of Connecticut, Storrs, CT, USA
Mei Wei
Affiliation:
Institute of Materials Science, University of Connecticut, Storrs, CT, USA
Mark Aindow
Affiliation:
Institute of Materials Science, University of Connecticut, Storrs, CT, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 288 - 289
Copyright
© Microscopy Society of America 2017 

References

[1] Bassim, N, Scott, K & Giannuzzi, LA MRS Bulletin vol. 39 2014). pp 317.CrossRefGoogle Scholar
[2] Burnett, TL, et al, Ultramicros. vol. 161 2016). pp 119.CrossRefGoogle Scholar
[3] Hu, C, Aindow, M & Wei, M Surf Coat. Tech 313 2017). pp 255.CrossRefGoogle Scholar
[4] Unocic, KA, Mills, MJ & Daehn, GS J. Micros. vol. 240 2010). pp 227.CrossRefGoogle Scholar
[5] Watson, TJ, et al, ScriptaMater 123 2016 51.Google Scholar
[6] This work was supported in part by a research grant from FEI Company under an FEI-UConn partnership agreement. The studies were performed in the UConn/FEI Center for Advanced Microscopy and Materials Analysis (CAMMA).Google Scholar