Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-24T22:28:20.998Z Has data issue: false hasContentIssue false
  • English
  • Français

Comparison of Electron Channeling Contrast Imaging (ECCI) and Electron Back Scattered Diffraction (EBSD) using Hitachi SU8000 FE-SEM

Published online by Cambridge University Press:  23 November 2012

S. Kaboli ,
J. Su  and
R. Gauvin
S. Kaboli
Affiliation:
Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
J. Su
Affiliation:
McGill University, Montreal, Quebec, Canada
R. Gauvin
Affiliation:
McGill University, Montreal, Quebec, Canada
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 700 - 701
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)