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Comparing Transmission Electron Microscopy (TEM) and Tomographic Atom Probe (TAP) through Measurements of Thin Multilayers

Published online by Cambridge University Press:  07 September 2007

T Heil ,
P Stender ,
G Schmitz  and
H Kohl
T Heil
Affiliation:
Universität Münster,Germany
P Stender
Affiliation:
Universität Münster,Germany
G Schmitz
Affiliation:
Universität Münster,Germany
H Kohl
Affiliation:
Universität Münster,Germany
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Extract

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S03 , September 2007 , pp. 398 - 399
Copyright
Copyright © Microscopy Society of America 2007

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