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Comparing Elemental Sensitivities Obtained With an Aperture and a Monolithic Polycapillary Optic Using a Commercial Micro-X-Ray Fluorescence (MXRF) Instrument

Published online by Cambridge University Press:  02 July 2020

C. G. Worley ,
L. P. Colletti  and
G. J. Havrilla
C. G. Worley
Affiliation:
Los Alamos National Laboratory, Inorganic Elemental Analysis, MS G740, Los Alamos, NM, 87545
L. P. Colletti
Affiliation:
Los Alamos National Laboratory, Inorganic Elemental Analysis, MS G740, Los Alamos, NM, 87545
G. J. Havrilla
Affiliation:
Los Alamos National Laboratory, Inorganic Elemental Analysis, MS G740, Los Alamos, NM, 87545
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Extract

Recent MXRF reports have demonstrated marked x-ray flux enhancements over traditional aperturecollimating systems when using a total reflection capillary optic. In the present work, several standard reference materials (SRMs) were examined with a Kevex Omicron MXRF system to compare the elemental sensitivities achieved with an aperture x-ray guide to those obtained with a monolithic polycapillary optic (X-ray Optical Systems). This study is relevant to the MXRF community using commercial aperture-based instruments where trace elemental concentrations in a sample sometimes mandate the need for a higher primary x-ray dose, but the flexibility of incorporating various sized apertures for other samples is still maintained.

By scanning the x-ray beam over a nickel/gold knife edge, the capillary focal spot diameter at the time of this work was determined to be ∼400 μm, while a 300 μm aperture provided a beam size of ∼550 μm due to beam divergence past the aperture.

Type
Novel X-Ray Methods: From Microscopy to Ultimate Detectability
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 380 - 381
Copyright
Copyright © Microscopy Society of America

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References

1.Pella, P. A. and Lankosz, M.. X-ray Spectrom. 26(1997)327.3.0.CO;2-5>CrossRefGoogle Scholar
2. The authors gratefully acknowledge the Department of Energy for funding. Los Alamos is operated by the University of California for the Department of Energy. Identification of specific vendors is not an endorsement of particular instrumentation.Google Scholar