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A Comparative Analysis of a Si/SiGe Heterojunction-Bipolar Transistors: APT, STEM-EDX and ToF-SIMS
Published online by Cambridge University Press: 23 September 2015
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- Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 689 - 690
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- Copyright © Microscopy Society of America 2015
References
[4] This study has been performed at the nanocharacterisation platform (PFNC) of theMinatec Campus and ST Microelectonics, Crolles. The author would like to acknowledge a CIFRE (ANRT) scholarship.Google Scholar
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