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Combining Spatial and Temporal Resolution in Cryo-TEM of Device Materials

Published online by Cambridge University Press:  22 July 2022

Nikita S. Dutta ,
Nakita K. Noel ,
Craig B. Arnold ,
Katherine Jungjohann  and
Mowafak Al-Jassim
Nikita S. Dutta*
Affiliation:
National Renewable Energy Laboratory, Golden, CO, United States
Nakita K. Noel
Affiliation:
Department of Physics, University of Oxford, Oxford, United Kingdom
Craig B. Arnold
Affiliation:
Department of Mechanical and Aerospace Engineering and the Princeton Institute for Science and Technology of Materials, Princeton University, Princeton, NJ, United States
Katherine Jungjohann
Affiliation:
National Renewable Energy Laboratory, Golden, CO, United States
Mowafak Al-Jassim*
Affiliation:
National Renewable Energy Laboratory, Golden, CO, United States
*
*Corresponding authors: [email protected]; [email protected]
*Corresponding authors: [email protected]; [email protected]

Abstract

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Type
Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2162 - 2163
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Copyright
Copyright © Microscopy Society of America 2022

References

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We acknowledge the use of Princeton's Imaging and Analysis Center, which is partially supported by the Princeton Center for Complex Materials, a National Science Foundation (NSF)-MRSEC program. This work was authored in part by the National Renewable Energy Laboratory, operated by Alliance for Sustainable Energy, LLC, for the U.S. Department of Energy (DOE) under Contract No. DE-AC36-08GO28308. This work was supported by the Laboratory Directed Research and Development (LDRD) Program at NREL. The views expressed in the article do not necessarily represent the views of the DOE or the U.S. Government. The U.S. Government retains and the publisher, by accepting the article for publication, acknowledges that the U.S. Government retains a nonexclusive, paid-up, irrevocable, worldwide license to publish or reproduce the published form of this work, or allow others to do so, for U.S. Government purposes.Google Scholar