Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-12-01T02:05:56.185Z Has data issue: false hasContentIssue false
  • English
  • Français

Combining in-Situ SEM with High Sensitivity Analytical TEM for Understanding the Degradation of Metallic Interconnects in SOFC

Published online by Cambridge University Press:  04 August 2017

Stéphane Poitel ,
Zhu-Jun Wang ,
Marc Willinger ,
Jan van Herle  and
Cécile Hébert
Stéphane Poitel
Affiliation:
Centre Interdisciplinaire de Microscopie Electronique, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland. Group of Energy Materials, Ecole Polytechnique Fédérale de Lausanne, Sion, Switzerland.
Zhu-Jun Wang
Affiliation:
Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Berlin, Germany.
Marc Willinger
Affiliation:
Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Berlin, Germany.
Jan van Herle
Affiliation:
Group of Energy Materials, Ecole Polytechnique Fédérale de Lausanne, Sion, Switzerland.
Cécile Hébert
Affiliation:
Centre Interdisciplinaire de Microscopie Electronique, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 2060 - 2061
Copyright
© Microscopy Society of America 2017 

References

[1] Fergus, J. W International Journal of Hydrogen Energy 32 2007). p. 3664.CrossRefGoogle Scholar
[2] Froitzheim, J. & Svensson, J.-E. ECS Trans 35 2011). p. 2503.CrossRefGoogle Scholar
[3] Harthøj, A., Holt, T. & Mailer, P. Journal of Power Sources 281 2015). p. 227.CrossRefGoogle Scholar