Hostname: page-component-cd9895bd7-dk4vv Total loading time: 0 Render date: 2024-12-27T12:51:22.754Z Has data issue: false hasContentIssue false
  • English
  • Français

Combining Atomic-Scale EDX with Inelastic Multislice Simulations for Quantitative Chemical Analysis of AlGaN/GaN 1 nm-thick Quantum Wells

Published online by Cambridge University Press:  22 July 2022

Florian Castioni ,
Sergi Cuesta ,
Nicolas Bernier ,
Patrick Quéméré ,
Eric Robin ,
Vincent Delaye ,
Eva Monroy  and
Pascale Bayle-Guillemaud
Florian Castioni*
Affiliation:
 Univ. Grenoble Alpes, CEA, LETI, Grenoble, France
Sergi Cuesta
Affiliation:
 Univ. Grenoble Alpes, CEA, IRIG, Grenoble, France
Nicolas Bernier
Affiliation:
 Univ. Grenoble Alpes, CEA, LETI, Grenoble, France
Patrick Quéméré
Affiliation:
 Univ. Grenoble Alpes, CEA, LETI, Grenoble, France
Eric Robin
Affiliation:
 Univ. Grenoble Alpes, CEA, IRIG, Grenoble, France
Vincent Delaye
Affiliation:
 Univ. Grenoble Alpes, CEA, LETI, Grenoble, France
Eva Monroy
Affiliation:
 Univ. Grenoble Alpes, CEA, IRIG, Grenoble, France
Pascale Bayle-Guillemaud
Affiliation:
 Univ. Grenoble Alpes, CEA, IRIG, Grenoble, France
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2564 - 2566
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Asif Khan, M. et al. , Jpn. J. Appl. Phys. 44 (2005) 7191–7206. https://doi.org/10.1143/JJAP.44.7191.CrossRefGoogle Scholar
Liu, J., Microsc Microanal. 27 (2021) 943–995. https://doi.org/10.1017/S1431927621012125.CrossRefGoogle Scholar
Lugg, N.R. et al. , Ultramicroscopy. 151 (2015) 150–159. https://doi.org/10.1016/j.ultramic.2014.11.029.CrossRefGoogle Scholar
Nguyen, D.T., Findlay, S.D., Etheridge, J., Ultramicroscopy. 146 (2014) 6–16. https://doi.org/10.1016/j.ultramic.2014.04.008.CrossRefGoogle Scholar
Allen, L.J., D׳Alfonso, A.J., Findlay, S.D., Ultramicroscopy. 151 (2015) 11–22. https://doi.org/10.1016/j.ultramic.2014.10.011.CrossRefGoogle Scholar
This work, done on the NanoCharacterisation PlatForm (PFNC), was supported by the “Recherches Technologiques de Base” Program of the French Ministry of Research.Google Scholar