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Combined Confocal Raman Microscope with Scanning Electron Microscope; A Parallel Analysis of Inorganic and Organic Materials

Published online by Cambridge University Press:  01 August 2002

Y. Aksenov
Affiliation:
University of Twente, Fac. Applied physics
A.A. van Apeldoorn
Affiliation:
University of Twente, Fac. Applied physics Isotis NV, P.O.box 98, 32723 AB Bilthoven, The Netherlands
J.D. de Bruijn
Affiliation:
Isotis NV, P.O.box 98, 32723 AB Bilthoven, The Netherlands
C.A. van Blitterswijk
Affiliation:
University of Twente, Fac. Applied physics Isotis NV, P.O.box 98, 32723 AB Bilthoven, The Netherlands
J. Greve
Affiliation:
University of Twente, Fac. Applied physics
C. Otto
Affiliation:
University of Twente, Fac. Applied physics

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2002