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Combined CBED/Alchemi Analysis of Crystallography and Cation Distributions in the Transparent Conductive Oxide Cd1+XIn2-2XSnxO4

Published online by Cambridge University Press:  02 July 2020

L.N. Brewer ,
D.R. Kammler ,
T.O. Mason  and
V.P. Dravid
L.N. Brewer
Affiliation:
Department of Materials Science and Engineering, Northwestern University, 2225 N. Campus Dr., Evanston, IL60208
D.R. Kammler
Affiliation:
Department of Materials Science and Engineering, Northwestern University, 2225 N. Campus Dr., Evanston, IL60208
T.O. Mason
Affiliation:
Department of Materials Science and Engineering, Northwestern University, 2225 N. Campus Dr., Evanston, IL60208
V.P. Dravid
Affiliation:
Department of Materials Science and Engineering, Northwestern University, 2225 N. Campus Dr., Evanston, IL60208
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Extract

Transparent conductive oxide materials (TCO) are currently under development for use as electrodes in optical systems such as photovoltaics and flat panel displays. Indium-tin based oxides and cadmium-tin based oxides have been investigated in the past but have received more attention recently due to their high electron mobilities. The mechanisms for conduction in these systems are not fully understood, but the distribution of cations within the lattice is thought to be of importance. We are currently studying the Cd1+xIn2-2xSnxO4 system for use as a TCO material. In particular, we are interested in the effect of the crystallography and cation distributions in this material upon its electro-optical properties.

The investigation of cation distributions in this spinel system presents special challenges to purely diffraction based methods. X-ray diffraction cannot be used to assess the cation distribution for this system due to the similar x-ray atomic scattering factors for the cations involved.

Type
Ceramics & Minerals
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 396 - 397
Copyright
Copyright © Microscopy Society of America

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References

References:

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6 We gratefully acknowledge the support of the DOE-NREL Contract # AAD-9-18668-05Google Scholar