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Combined Atomic Force and Confocal Laser Scanning Microscope

Published online by Cambridge University Press:  08 August 2003

P.E. Hillner ,
D.A. Walters ,
R. Lal ,
H.G. Hansma  and
RK. Hansma
P.E. Hillner
Affiliation:
Department of Physics, University of California, Santa Barbara, CA 93106
D.A. Walters
Affiliation:
Department of Physics, University of California, Santa Barbara, CA 93106
R. Lal
Affiliation:
Department of Physics, University of California, Santa Barbara, CA 93106
H.G. Hansma
Affiliation:
Department of Physics, University of California, Santa Barbara, CA 93106
RK. Hansma
Affiliation:
Department of Physics, University of California, Santa Barbara, CA 93106
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Abstract

We present a novel combined atomic force microscope (AFM) and confocal laser scanning microscope (CLSM). The sample is supported from the side by a boom from a piezo tube scanner, allowing top and bottom access to the sample. The sample is scanned above an inverted microscope objective with a fixed optical path for fluorescent CLSM imaging. An AFM positioned directly above the sample simultaneously measures surface topography. The piezo tube scanner is angled, placing its center of scan curvature directly above the microscope objective. This geometry allows flat scans up to 300 μm on a side. Because the sample is scanned, the AFM and CLSM images are acquired in direct registration.

Keywords

confocalscanningforceintegratedcorrelativemicroscopy
Type
Research Article
Information
Microscopy and Microanalysis , Volume 1 , Issue 3 , June 1995 , pp. 127 - 130
Copyright
© 1995 Microscopy Society of America

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