Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-24T13:04:29.562Z Has data issue: false hasContentIssue false
  • English
  • Français

Combinatorial Gradient Reference Specimens for Advanced Scanned Probe Microscopy Techniques

Published online by Cambridge University Press:  01 August 2004

Michael J Fasolka ,
Duangrut Julthongpiput ,
Eric J Amis ,
Tinh Nguyen  and
Xiaohong Gu
Michael J Fasolka
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
Duangrut Julthongpiput
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
Eric J Amis
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
Tinh Nguyen
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
Xiaohong Gu
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 136 - 137
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)