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Collection of Selected Area Electron Channeling Patterns (SACP) on an FEI Helios NanoLab Scanning Electron Microscope

Published online by Cambridge University Press:  04 August 2017

R.D. Kerns ,
S. Balachandran ,
A.H. Hunter  and
M.A. Crimp
R.D. Kerns
Affiliation:
Michigan Center for Materials Characterization, University of Michigan, Ann Arbor, MI
S. Balachandran
Affiliation:
Department of Chemical Engineering and Materials Science, Michigan State University, East Lansing, MI
A.H. Hunter
Affiliation:
Michigan Center for Materials Characterization, University of Michigan, Ann Arbor, MI
M.A. Crimp
Affiliation:
Michigan Center for Materials Characterization, University of Michigan, Ann Arbor, MI

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 548 - 549
Copyright
© Microscopy Society of America 2017 

References

[1] Guyon, J., et al, Ultramicroscopy 149 2015). p. 34.Google Scholar
[2] Crimp, M.A. Microscopy Research and Technique 69 2006). p. 374.Google Scholar