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Coherence and Inelastic Scattering in Electron Microscopy

Published online by Cambridge University Press:  22 July 2022

C. Kisielowski*
Affiliation:
TMF, Lawrence Berkeley National Laboratory, One Cyclotron Rd., Berkeley, CA 94720, USA
P. Specht
Affiliation:
Department of MSE, University of California Berkeley, Berkeley, CA 94720, USA
B. Freitag
Affiliation:
Thermo Fisher Scientific, Achtseweg Noord 5, 5651 GG Eindhoven, The Netherlands
E.R. Kieft
Affiliation:
Thermo Fisher Scientific, Achtseweg Noord 5, 5651 GG Eindhoven, The Netherlands
S. Rozeveld
Affiliation:
The Dow Chemical Company, Midland, MI 48667, USA
J. Kang
Affiliation:
The Dow Chemical Company, Midland, MI 48667, USA
A.J. Fielitz
Affiliation:
The Dow Chemical Company, Midland, MI 48667, USA
T.R. Fielitz
Affiliation:
The Dow Chemical Company, Midland, MI 48667, USA
D.F. Yancey
Affiliation:
The Dow Chemical Company, Midland, MI 48667, USA
D. van Dyck
Affiliation:
EMAT, University of Antwerp, 2020 Antwerp, Belgium
*
*Corresponding author: [email protected]

Abstract

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Type
Memorial Symposium: John C.H. Spence
Copyright
Copyright © Microscopy Society of America 2022

References

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Kisielowski, C., Specht, P., Rozeveld, S., et al. . Microscopy and Microanalysis 27 (2021) 1420-1430CrossRefGoogle Scholar
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Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231Google Scholar