Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-12-01T06:50:19.580Z Has data issue: false hasContentIssue false

Choosing a Scanning Electron Microscope

Published online by Cambridge University Press:  02 July 2020

W. A. Lambe
Affiliation:
Exxon Research & Engineering Company, Annandale, NJ, 08801
P.M. Brady
Affiliation:
Exxon Research & Engineering Company, Annandale, NJ, 08801
Get access

Extract

The variety of instrumentation available to the researcher today can be overwhelming and confusing. Scanning Electron Microscopes (“SEM's) are no exception, and choosing one can often serve as an exercise in dealing with complexity. First time purchasers are most at risk, being subject to a barrage of information that attempts to sway the purchaser in one direction or the other. As a result, one can sometimes be drawn to the details of the latest “high end” performance parameter, while overlooking the basics. At its worst, the selection process can degrade to one of vague guesswork with little hard data to serve as a compass.

By applying a methodical approach to define your individual requirements, carefully designed tests of actual instruments, and discussions with your collaborators, potential and experienced users, one can begin to ensure a successful selection process.

Type
Instrumentation: How to Choose it and Use it
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Goldstein, J. I. et al., Scanning Electron Microscopy and X-Ray Microanalysis, Second Edition, New York Plenum (1992).CrossRefGoogle Scholar