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Chemical Etching Tip Processing for Magneto-Optical ScanningNear-Field Optical Microscopy

Published online by Cambridge University Press:  30 December 2005

J. Schoenmaker ,
M. Pojar ,
A. D. Barra-Barrera ,
A. C. Seabra  and
A. D. Santos
J. Schoenmaker
Affiliation:
Instituto de Física da Universidade de Sao Paulo, Brazil
M. Pojar
Affiliation:
Instituto de Física da Universidade de Sao Paulo, Brazil
A. D. Barra-Barrera
Affiliation:
Instituto de Física da Universidade de Sao Paulo, Brazil
A. C. Seabra
Affiliation:
Escola Politécnica da Universidade de Sao Paulo, Brazil
A. D. Santos
Affiliation:
Instituto de Física da Universidade de Sao Paulo, Brazil
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Extract

Nanoscale resolution in microscopy characterization has become crucial for state-of-the-art science and technology. We have developed a Magneto-optical Scanning Near-Field Optical Microscope (MO-SNOM), and it has demonstrated to be a powerful tool to study local magnetic properties [1,2]. One of the critical steps in producing a reliable instrument and consistent images is the fabrication of the microscope tip. This work presents concepts and results on tip processing by chemical etching on FS-SN-3224 optical fibers from 3M. The quality of the tips produced was tested on magnetic multilayers presenting exchange-bias coupling.

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Microscopy and Microanalysis , Volume 11 , Issue S03 , December 2005 , pp. 18 - 21
Copyright
© 2005 Microscopy Society of America

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