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Charge-contrast in SEM imaging with simultaneous ion bombardment

Published online by Cambridge University Press:  03 August 2008

BD Myers ,
JR Wilson ,
VP Dravid  and
SA Barnett
BD Myers
Affiliation:
Northwestern University
JR Wilson
Affiliation:
Northwestern University
VP Dravid
Affiliation:
Northwestern University
SA Barnett
Affiliation:
Northwestern University
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1012 - 1013
Copyright
© 2008 Microscopy Society of America

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