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The Charge Ordering Behavior of Colossal Magnetoresistive (CMR) Layered Compounds La2-2xSr1+2xMn2O7 (x = 0.5 ∼ 0.6)

Published online by Cambridge University Press:  02 July 2020

Z. P. Luo ,
D. J. Miller  and
J. F. Mitchell
Z. P. Luo
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL , 60439
D. J. Miller
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL , 60439
J. F. Mitchell
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL , 60439
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Abstract

In colossal magnetoresistive (CMR) materials, large changes in physical properties stem from the interplay between charge ordering (CO) coupled with orbital and magnetic orderings. Thus detailed microstructural studies are important in understanding these changes in physical properties. In-situTEM observation is a very useful approach to study CO transitions in these CMR compounds. We have recently studied the CO behavior of the three-dimensional perovskite Nd1/2Sr1+2xMnO3. in this work, we report the CO of two-dimensional naturally layered compounds La2-2xSr1+2xMn2O7 (327 phase), where x is the hole doping level and varies from 0.5 to 0.6 in this work.

Thin foil TEM specimens were prepared from polycrystalline bulk samples by conventional thinning and ion milling method at liquid N2 temperature. The in-situ TEM work was carried out in the Electron Microscopy Center at Argonne National Laboratory using a Philips CM30 with a liquid N2 cold stage, and a Hitachi H-9000 with liquid He cold stage.

Type
Novel Microscopy Assisted Ceramic Developments in Materials Scienceand Nanotechnology (Organized by P. Gai and J. Lee)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 410 - 411
Copyright
Copyright © Microscopy Society of America 2001

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References

1.Mitchell, J.F. et al.,Phys. Rev. B 54 (1996) 6172.CrossRefGoogle Scholar
2.Luo, Z.P., Miller, D.J., and Mitchell, J.F., Microsc. Microanal. 6 (2000), Suppl., 404.CrossRefGoogle Scholar
3.Li, J.Q., Matsui, Y., Kimura, T., and Tokura, Y., Phys. Rev. B 57 (1998) R3205.CrossRefGoogle Scholar
4. Supported by the U.S. Department of Energy, Division of Basic Energy Sciences-Material Sciences, under contract W-31-109-Eng-38. Electron microscopy was carried out in the Electron Microscopy Center at Argonne National Laboratory.Google Scholar