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Charge Density Mapping via Scanning Diffraction in Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  05 August 2019

Christopher Addiego ,
Wenpei Gao  and
Xiaoqing Pan
Christopher Addiego
Affiliation:
Department of Physics and Astronomy, University of California – Irvine, Irvine, CA 92697, USA
Wenpei Gao
Affiliation:
Department of Chemical Engineering and Materials Science, University of California – Irvine, Irvine, CA 92697, USA
Xiaoqing Pan
Affiliation:
Department of Physics and Astronomy, University of California – Irvine, Irvine, CA 92697, USA Department of Chemical Engineering and Materials Science, University of California – Irvine, Irvine, CA 92697, USA Irvine Materials Research Institute, University of California – Irvine, Irvine, CA 92697, USA

Abstract

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Type
Advances in Phase Retrieval Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 18 - 19
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Nakashima, P. N. H., et al. , Science 311 (2011), 1583-1586.Google Scholar
[2]Müller-Caspary, K., et al. , Ultramicroscopy 178 (2016), 62-80Google Scholar
[3]Nelson, C.T., et al. , Nano Letters 11 (2011), 828-824Google Scholar
[4]This work was supported by the Department of Energy (DOE) under Grant DE-SC0014430. TEM experiments was conducted using the facilities in the Irvine Materials Research Institute (IMRI) at the University of California-Irvine.Google Scholar