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Characterizing Failure in Commercial Li-Ion Batteries with 4D X-Ray Microscopy

Published online by Cambridge University Press:  23 September 2015

Jeff Gelb ,
Paul Shearing ,
Donal Finegan  and
Dan Brett
Jeff Gelb
Affiliation:
San Jose State University, Department of Chemical and Materials Engineering, San Jose, CA, USA Carl Zeiss X-Ray Microscopy, Inc., Pleasanton, CA, USA
Paul Shearing
Affiliation:
University College London, Department of Chemical Engineering, London, UK
Donal Finegan
Affiliation:
University College London, Department of Chemical Engineering, London, UK
Dan Brett
Affiliation:
University College London, Department of Chemical Engineering, London, UK

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 447 - 448
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Merkle, A P & Gelb, J, Microscopy Today (2013). pp. 10–15.CrossRefGoogle Scholar
[2] Eastwood, D S, et. al.., Advanced Energy Materials 4 (2013). p. 1–7.Google Scholar