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Characterization of Trapped Charge in Ge/LixGe Core/Shell Structure during Lithiation using Off-axis Electron Holography

Published online by Cambridge University Press:  23 September 2015

Z. Gan ,
M. Gu ,
J. Tang ,
C. Y. Wang ,
K. L. Wang ,
C. M. Wang ,
D. J. Smith  and
M. R. McCartney
Z. Gan
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287
M. Gu
Affiliation:
Environmental Molecular Sciences Lab, Pacific Northwest National Laboratory, Richland, WA 99352
J. Tang
Affiliation:
Device Research Lab., Dept. Electrical Engineering, University California, Los Angeles, CA 90095
C. Y. Wang
Affiliation:
Department of Materials Science and Engineering, National Taiwan University of Science and Technology, Taipei City, Taiwan, 10607, Republic of China
K. L. Wang
Affiliation:
Device Research Lab., Dept. Electrical Engineering, University California, Los Angeles, CA 90095
C. M. Wang
Affiliation:
Environmental Molecular Sciences Lab, Pacific Northwest National Laboratory, Richland, WA 99352
D. J. Smith
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287
M. R. McCartney
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1397 - 1398
Copyright
Copyright © Microscopy Society of America 2015 

References

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[2] Arico, A. S., et al., Nature Materials 4 (2005) 366.Google Scholar
[3] Larcher, D., et al., Journal of Materials Chemistry 17 (2007) 3759.Google Scholar
[4] McCartney, M. R. & Smith, D. J., Ann. Rev. Mater. Res. 37 (2007) 729.Google Scholar
[5] Li, J., et al., Acta. Crystal. Sec. A 55 (1999) 652.Google Scholar
[6] The electron holography studies have been supported by DoE Grant DE-FG02-04ER46168. We also acknowledge use of the EMSL user facilities..Google Scholar