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Characterization of TiAl diffusion bonds using Ni/Ti nanolayers
Published online by Cambridge University Press: 14 March 2016
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- Material Sciences
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- Copyright © Microscopy Society of America 2016
References
[3]Simões, S., Viana, F., Volker, V., Koçak, M., Ramos, A. S., Vieira, M. T. & Vieira, M. F., Journal of Materials Science 45 (2010). p. 4351.CrossRefGoogle Scholar
[4]Simões, S., Viana, F., Ramos, A. S., Vieira, M. T. & Vieira, M. F., Microscopy and Microanalysis 21 (2015). p. 132.Google Scholar
[5] This research is sponsored by FEDER funds through the program COMPETE – Programa Operacional Factores de Competitividade – and by national funds through FCT – Fundação para a Ciência e a Tecnologia –, under the project PEst-C/EME/UI0285/2013.Google Scholar
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