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Characterization of TiAl diffusion bonds using Ni/Ti nanolayers

Published online by Cambridge University Press:  14 March 2016

Sónia Simões
Affiliation:
CEMUC, Department of Metallurgical and Materials Engineering, University of Porto, R. Dr. Roberto Frias, 4200-465 Porto, Portugal.
Filomena Viana
Affiliation:
CEMUC, Department of Metallurgical and Materials Engineering, University of Porto, R. Dr. Roberto Frias, 4200-465 Porto, Portugal.
Ana Sofia Ramos
Affiliation:
CEMUC, Department of Mechanical Engineering, University of Coimbra, R. Luís Reis Santos, 3030-788 Coimbra, Portugal.
Maria Teresa Vieira
Affiliation:
CEMUC, Department of Mechanical Engineering, University of Coimbra, R. Luís Reis Santos, 3030-788 Coimbra, Portugal.
Manuel F. Vieira
Affiliation:
CEMUC, Department of Metallurgical and Materials Engineering, University of Porto, R. Dr. Roberto Frias, 4200-465 Porto, Portugal.

Abstract

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Type
Material Sciences
Copyright
Copyright © Microscopy Society of America 2016 

References

[1]Wu, X., Intermetallics 14 (2006). p. 1114.Google Scholar
[2]Clemens, H. & Mayer, S., Advanced Engineering Materials 15 (2013). p. 191.Google Scholar
[3]Simões, S., Viana, F., Volker, V., Koçak, M., Ramos, A. S., Vieira, M. T. & Vieira, M. F., Journal of Materials Science 45 (2010). p. 4351.CrossRefGoogle Scholar
[4]Simões, S., Viana, F., Ramos, A. S., Vieira, M. T. & Vieira, M. F., Microscopy and Microanalysis 21 (2015). p. 132.Google Scholar
[5] This research is sponsored by FEDER funds through the program COMPETE – Programa Operacional Factores de Competitividade – and by national funds through FCT – Fundação para a Ciência e a Tecnologia –, under the project PEst-C/EME/UI0285/2013.Google Scholar