Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-24T18:51:12.523Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterization of the CoFe2O4@MnFe2O4 Magnetic Particles Using Differential Phase Contrast in STEM

Published online by Cambridge University Press:  25 July 2016

Dong-yeob Kim ,
Jong-ick Son ,
Chan-hyuk Rhee ,
Byung-kyu Park ,
Sung-hun Lee ,
Hyun-kyung Choi ,
Sam-Jin Kim  and
In-bo Sim
Dong-yeob Kim
Affiliation:
. FEI Korea, AICT 5F, Gwanggyo-ro, Yeoungtong-ku, Suwon-si, Republic of Korea.
Jong-ick Son
Affiliation:
. FEI Korea, AICT 5F, Gwanggyo-ro, Yeoungtong-ku, Suwon-si, Republic of Korea.
Chan-hyuk Rhee
Affiliation:
. FEI Korea, AICT 5F, Gwanggyo-ro, Yeoungtong-ku, Suwon-si, Republic of Korea.
Byung-kyu Park
Affiliation:
. FEI Korea, AICT 5F, Gwanggyo-ro, Yeoungtong-ku, Suwon-si, Republic of Korea.
Sung-hun Lee
Affiliation:
. FEI Korea, AICT 5F, Gwanggyo-ro, Yeoungtong-ku, Suwon-si, Republic of Korea.
Hyun-kyung Choi
Affiliation:
. Department of Physics, Kookmin University, Seoul, Republic of Korea
Sam-Jin Kim
Affiliation:
. Department of Physics, Kookmin University, Seoul, Republic of Korea
In-bo Sim
Affiliation:
. Department of Physics, Kookmin University, Seoul, Republic of Korea

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1712 - 1713
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Burda, C, Chen, X & Narayanan, R Chem.Rev (2005) 105, p. 1025–1102.Google Scholar
[2] Caruso, Frank, Susha, Andrei S. & Giersig, Michael Adv. Mater (1999) 11. No. 11.Google Scholar
[3] Yin, Y. & Alivisatos, A.P. Nature (2005) 437, 664–670.Google Scholar
[4] Song, Qing & John Zhang, Z J.Am.Chem.Soc. (2012) 134, p. 10182–10190.Google Scholar
[5] David, Williams B in “Transmission Electron Microscopy”, (Publisher, Springer-Verlag US) p.3.Google Scholar
[6] McCartney, M.R, Kruit, P & Buist, A.H Ultramicroscopy (1996) 65, p. 179–186.CrossRefGoogle Scholar
[7] Lohr, Matthias, Schregle, Ralph & jetter, Michael Ultramicroscopy (2012) 117, p. 7–14.Google Scholar