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Characterization of Nano-scale Instabilities in Titanium Alloys Using Aberration-Corrected Scanning Transmission Electron Microscope

Published online by Cambridge University Press:  25 July 2016

Yufeng Zheng ,
Robert E.A. Williams  and
Hamish L. Fraser
Yufeng Zheng
Affiliation:
Center for the Accelerated Maturation of Materials and Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, USA
Robert E.A. Williams
Affiliation:
Center for the Accelerated Maturation of Materials and Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, USA
Hamish L. Fraser
Affiliation:
Center for the Accelerated Maturation of Materials and Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1270 - 1271
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Zheng, Y., et al, Scripta Materialia 111 (2016). p. 81.Google Scholar
[2] Zheng, Y., et al, Acta Materialia 103 (2016). p. 165.Google Scholar
[3] Zheng, Y., et al, Acta Materialia 103 (2016). p. 850.Google Scholar
[4] Fraser, H.L., et al, Transmission Electron Microscopy for Physical Metallurgists Elsevier Science, Burlington, 2014.Google Scholar
[5] Zheng, Y., et al, Scripta Materialia 113 (2016). p. 202.Google Scholar
[6] Zheng, Y., et al, Scripta Materialia 116 (2016). p. 49.Google Scholar