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Characterization of nanolayers at TiAl diffusion bonds

Published online by Cambridge University Press:  10 September 2015

S. Simões ,
F. Viana ,
A. S. Ramos ,
M. T. Vieira  and
M. F. Vieira
S. Simões*
Affiliation:
CEMUC, Department of Metallurgical and Materials Engineering, University of Porto, R. Dr. Roberto Frias, 4200-465 Porto, Portugal
F. Viana
Affiliation:
CEMUC, Department of Metallurgical and Materials Engineering, University of Porto, R. Dr. Roberto Frias, 4200-465 Porto, Portugal
A. S. Ramos
Affiliation:
CEMUC, Department of Mechanical Engineering, University of Coimbra, R. Luís Reis Santos, 3030-788 Coimbra, Portugal
M. T. Vieira
Affiliation:
CEMUC, Department of Mechanical Engineering, University of Coimbra, R. Luís Reis Santos, 3030-788 Coimbra, Portugal
M. F. Vieira
Affiliation:
CEMUC, Department of Metallurgical and Materials Engineering, University of Porto, R. Dr. Roberto Frias, 4200-465 Porto, Portugal
*
Email: [email protected]

Abstract

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Type
Material Sciences
Information
Microscopy and Microanalysis , Volume 21 , Supplement S6: Introduction to the SPMicros Special Issue from the XLVII Annual Congress , August 2015 , pp. 96 - 97
Copyright
Copyright © Microscopy Society of America 2015 

References

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[2]Froes, F. H., et al., Journal of Material. Science 27, 5113–5140, 1992.Google Scholar
[3]Çam, G., et al., Journal of Material. Science 4, 5273–5282, 2006.Google Scholar
[4]Simões, S., et al., Journal of Material. Science 45, 4351–4357, 2010.Google Scholar