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Characterization of Nanodevices by using In-Situ TEM-STM

Published online by Cambridge University Press:  03 August 2008

J Kim ,
D Cha ,
SY Park  and
MJ Kim
J Kim
Affiliation:
University of Texas Dallas
D Cha
Affiliation:
University of Texas Dallas
SY Park
Affiliation:
University of Texas Dallas
MJ Kim
Affiliation:
University of Texas Dallas
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 20 - 21
Copyright
© 2008 Microscopy Society of America

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