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Characterization of Mixed Metal Oxide Interfaces Based on TiO2-supported CeO2-x Nanoparticles

Published online by Cambridge University Press:  01 August 2018

Diane M. Haiber ,
Tu-Uyen Phan ,
Kartik Venkatraman  and
Peter A. Crozier
Diane M. Haiber
Affiliation:
School for Engineering of Matter, Transport & Energy, Arizona State University, Tempe, Arizona 85287-6106, USA
Tu-Uyen Phan
Affiliation:
School for Engineering of Matter, Transport & Energy, Arizona State University, Tempe, Arizona 85287-6106, USA
Kartik Venkatraman
Affiliation:
School for Engineering of Matter, Transport & Energy, Arizona State University, Tempe, Arizona 85287-6106, USA
Peter A. Crozier
Affiliation:
School for Engineering of Matter, Transport & Energy, Arizona State University, Tempe, Arizona 85287-6106, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 458 - 459
Copyright
© Microscopy Society of America 2018 

References

[1] Magesh, G., et al, Indian J. Chem 2009 48A, 480–488.Google Scholar
[2] Kundu, S., et al, J. Phys. Chem. 2012 116, 14062–14070.Google Scholar
[3] Luo, S., et al, J. Phys. Chem. 2015 119, 2669–2679.Google Scholar
[4] Nian, J. Teng, H. J. Phys. Chem. B 2006 110, 4193–4198.Google Scholar
[5] Bowman, W.J., et al, Ultramicroscopy 2016 167, 5–10.Google Scholar
[6] Support from the U.S. DOE (DE-SC0004954), National Science Foundation (CHE-1508667), use of AC-TEM, XRD, and UV-VIS equipment within the LeRoy Eyring Center for Solid State Science at ASU are gratefully acknowledged.Google Scholar