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Characterization of Laser Ablation Dynamics for Nickel Thin Films on Silicon Using Movie Mode Dynamic TEM

Published online by Cambridge University Press:  23 September 2015

Sahar Hihath ,
Melissa K. Santala ,
Geoffrey Campbell  and
Klaus van Benthem
Sahar Hihath
Affiliation:
Department of Chemical Engineering and Materials Science, University of California, Davis, CA Department of Physics, University of California, Davis, CA
Melissa K. Santala
Affiliation:
Condensed Matter and Materials Division, Lawrence Livermore National Laboratory, Livermore, CA
Geoffrey Campbell
Affiliation:
Condensed Matter and Materials Division, Lawrence Livermore National Laboratory, Livermore, CA
Klaus van Benthem
Affiliation:
Department of Chemical Engineering and Materials Science, University of California, Davis, CA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1591 - 1592
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Sugioka, K., et al, Laser Precision Microfabrication. (Springer, Berlin Heidelberg), 2010). p 91–120.Google Scholar
[2] Strecker, A., et al, Metallkd 94 (2003), p 290–297.Google Scholar
[3] LaGrange, T., et al, MRS Bulletin 40 (2015), p 22–28.Google Scholar
[4] Hihath, S., Santala, Melissa, Campbell, Geoffrey & van Benthem, Klaus (submitted for publication).Google Scholar
[5] Trice, J., et.al, Physical Review B 75 (2007), p 1–15.Google Scholar
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[7] This work was supported by a University of California Laboratory Fee grant (#12-LR-238313). DTEM experiments at Lawrence Livermore National Laboratory were carried out under the auspices of the US Department of Energy, Office of Basic Energy Sciences under contract DE-AC52-07NA27344.Google Scholar