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Characterization of Interphase Interfaces Developed During the Ordering Transformation (ε (A3) →τ (L10)) In Manganese-Aluminum Alloys

Published online by Cambridge University Press:  02 July 2020

C. Yanar ,
J.M.K. Wiezorek ,
V. Radmilovic  and
W.A. Soffa
C. Yanar
Affiliation:
Department of Materials Science and Engineering, University of Pittsburgh, Pittsburgh, PA15261
J.M.K. Wiezorek
Affiliation:
Department of Materials Science and Engineering, University of Pittsburgh, Pittsburgh, PA15261
V. Radmilovic
Affiliation:
National Center for Electron Microscopy, Berkeley, CA, & Department of Physical Metallurgy, University of Belgrade, 11001Serbia
W.A. Soffa
Affiliation:
Department of Materials Science and Engineering, University of Pittsburgh, Pittsburgh, PA15261
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Extract

Alloys based on the ferromagnetic τ-phase, which may be established in the Mn-Al system for near equiatomic composition [1], exhibit high magnetocrystalline anisotropy and coercivity and are of interest for advanced permanent magnet applications [2], Their technologically important properties depend strongly on the microstructure and defect structure development associated with the transformation from the disordered hexagonal (A3) ε-phase to the ordered tetragonal (L10) τ-phase. The structure, morphology and chemistry of the (ε/τ) interphase interfaces have been studied by methods of optical and electron microscopy (OM, SEM and TEM) in order to determine the nature of this technically important and scientifically interesting phase transformation. The optimization of processing-property relationships for this class of ferromagnetic materials requires a detailed understanding of the mechanisms facilitating the ordering process.

The τ-phase nucleates at prior ε-grain boundaries (ε-GB) and exhibits a serrated, faceted growth morphology (FIG. l).

Type
Phase Transformations
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 364 - 365
Copyright
Copyright © Microscopy Society of America

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References

References:

1.Vlasova, N.I. et al., Phys. Met. Metallogr., 51 (1981) 1.Google Scholar
2.Hoydick, D.P. et al., Scripta Mater., 36 (1997) 151.CrossRefGoogle Scholar
3. Financial support of this work by grants from the NSF and DOE are gratefully acknowledged.Google Scholar