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Characterization of Dielectric Waveguides Through Photoemission Electron Microscopy (PEEM) in the Infrared Regime

Published online by Cambridge University Press:  23 September 2015

T. A. Stenmark ,
Robert C. Word  and
R. Konenkamp
T. A. Stenmark
Affiliation:
Department of Physics, Portland State University, Portland, OR 97201, USA
Robert C. Word
Affiliation:
Department of Physics, Portland State University, Portland, OR 97201, USA
R. Konenkamp
Affiliation:
Department of Physics, Portland State University, Portland, OR 97201, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1589 - 1590
Copyright
Copyright © Microscopy Society of America 2015 

References

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[3] Fitzgerald, JPS, Word, RC & Konenkamp, R, Phys. Rev B87 (2013) 205419.CrossRefGoogle Scholar
[4] Yariv, A., Optical Electronics. (Saunders College Publishing, Philadelphia, 1991).Google Scholar
[5] Niemma, M., Buckanie et al. Ultramicroscopy 130, 49 (2013).Google Scholar