Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-24T16:00:40.615Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterization of Amorphous Materials by Electron Diffraction and Atomistic Modeling

Published online by Cambridge University Press:  07 August 2002

D.J.H. Cockayne ,
D.R. McKenzie ,
W. McBride ,
C. Goringe  and
D. McCulloch
D.J.H. Cockayne*
Affiliation:
Australian Key Centre for Microscopy and Microanalysis, University of Sydney, Sydney, New South Wales 2006, Australia
D.R. McKenzie
Affiliation:
Australian Key Centre for Microscopy and Microanalysis, University of Sydney, Sydney, New South Wales 2006, Australia
W. McBride
Affiliation:
Australian Key Centre for Microscopy and Microanalysis, University of Sydney, Sydney, New South Wales 2006, Australia
C. Goringe
Affiliation:
Australian Key Centre for Microscopy and Microanalysis, University of Sydney, Sydney, New South Wales 2006, Australia
D. McCulloch
Affiliation:
Department of Applied Physics, RMIT—City Campus, GPO Box 2476V, Melbourne, Victoria 3001, Australia
*
*Corresponding author
Get access

Abstract

The technique of energy selected electron diffraction gives information about amorphous structures which can be used to characterize amorphous materials in terms of their structure. The diffraction data can be used to refine models obtained using molecular dynamics, resulting in physically reasonable models consistent with the diffraction data.

Keywords

electron diffractionamorphousmodellingenergy selectionpolycrystallinestructuresmolecular dynamics
Type
Research Article
Information
Microscopy and Microanalysis , Volume 6 , Issue 4 , July 2000 , pp. 329 - 334
Copyright
Copyright © Microscopy Society of America 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)