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Characterization of a Sub-Grain Boundary Using Accurate Electron Channeling Contrast Imaging

Published online by Cambridge University Press:  23 September 2015

H. Mansour ,
M.A. Crimp ,
N. Gey  and
N Maloufi
H. Mansour
Affiliation:
Laboratoire d'Etude des Microstructures et de Mecanique des Materiaux (LEM3), Universite de Lorraine, 57045 Metz, France
M.A. Crimp
Affiliation:
Michigan State University, Department of Chemical Engineering & Materials Science, 428 S. Shaw Lane, East Lansing, MI 48824, United States
N. Gey
Affiliation:
Laboratoire d'Etude des Microstructures et de Mecanique des Materiaux (LEM3), Universite de Lorraine, 57045 Metz, France Laboratory of Excellence on Design of Alloy Metals for low-mAssStructures (DAMAS), Universite de Lorraine, France
N Maloufi
Affiliation:
Laboratoire d'Etude des Microstructures et de Mecanique des Materiaux (LEM3), Universite de Lorraine, 57045 Metz, France Laboratory of Excellence on Design of Alloy Metals for low-mAssStructures (DAMAS), Universite de Lorraine, France

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 601 - 602
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Mansour, H., Guyon, J., Crimp, M.A, Gey, N., Beausir, B. & Maloufi, N., ScriptaMaterialia 84–85 (2014). p. 11–14.Google Scholar
[2] Guyon, J., Mansour, H., Crimp, M.A, Gey, N., Chalal, S. & Maloufi, N., Ultramicroscopy 149 (2015) 34–44.CrossRefGoogle Scholar