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Characterization of a Microcalorimeter in comparison to Silicon Drift Detectors

Published online by Cambridge University Press:  23 November 2012

R. Terborg
Affiliation:
Bruker Nano GmbH, Berlin, Germany
R. Cantor
Affiliation:
STAR Cryoelectronics, Santa Fe, NM
H. Naito
Affiliation:
H.K.N. Inc., San Jose, CA
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2012

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