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Characterization of 16 MegaPixel CMOS Detector for TEM by Evaluating Single Events of Primary Electrons

Published online by Cambridge University Press:  08 April 2017

R Ghadimi ,
I Daberkow ,
C Kofler ,
P Sparlinek  and
H Tietz
R Ghadimi
Affiliation:
TVIPS GmbH, Germany
I Daberkow
Affiliation:
TVIPS GmbH, Germany
C Kofler
Affiliation:
TVIPS GmbH, Germany
P Sparlinek
Affiliation:
TVIPS GmbH, Germany
H Tietz
Affiliation:
TVIPS GmbH, Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1208 - 1209
Copyright
Copyright © Microscopy Society of America 2011