Characterization of 16 MegaPixel CMOS Detector for TEM by Evaluating Single Events of Primary Electrons

R Ghadimi; I Daberkow; C Kofler; P Sparlinek; H Tietz

doi:10.1017/S143192761100691X

Characterization of 16 MegaPixel CMOS Detector for TEM by Evaluating Single Events of Primary Electrons

Published online by Cambridge University Press: 08 April 2017

R Ghadimi ,

I Daberkow ,

C Kofler ,

P Sparlinek and

H Tietz

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R Ghadimi: Affiliation:
TVIPS GmbH, Germany
I Daberkow: Affiliation:
TVIPS GmbH, Germany
C Kofler: Affiliation:
TVIPS GmbH, Germany
P Sparlinek: Affiliation:
TVIPS GmbH, Germany
H Tietz: Affiliation:
TVIPS GmbH, Germany

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1208 - 1209

DOI: https://doi.org/10.1017/S143192761100691X [Opens in a new window]

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Characterization of 16 MegaPixel CMOS Detector for TEM by Evaluating Single Events of Primary Electrons

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