Hostname: page-component-cd9895bd7-jn8rn Total loading time: 0 Render date: 2024-12-25T20:49:44.008Z Has data issue: false hasContentIssue false
  • English
  • Français

Challenges in FIB TEM Sample Preparation: Damage Issues and Solutions

Published online by Cambridge University Press:  22 July 2022

Xiangli Zhong ,
Xiaorong Zhou ,
Sarah J Haigh ,
Philip J Withers  and
M. Grace Burke
Xiangli Zhong*
Affiliation:
Department of Materials, University of Manchester
Xiaorong Zhou
Affiliation:
Department of Materials, University of Manchester
Sarah J Haigh
Affiliation:
Department of Materials, University of Manchester
Philip J Withers
Affiliation:
Department of Materials, University of Manchester
M. Grace Burke
Affiliation:
Oak Ridge National Laboratory
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 60 - 62
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Schaffer, M., Schaffer, B., and Ramasse, Q., Ultramicroscopy, vol. 114, pp. 62–71, 2012, doi: 10.1016/j.ultramic.2012.01.005.CrossRefGoogle Scholar
Bassim, N. D. et al. , J. Microsc., vol. 245, no. 3, pp. 288–301, 2012, doi: 10.1111/j.1365-2818.2011.03570.x.CrossRefGoogle Scholar
Zhong, X. et al. , J. Microsc., no. July, pp. 1–12, 2020, doi: 10.1111/jmi.12983.Google Scholar
Michael, J. R., pp. 386–397, 2011.CrossRefGoogle Scholar
Mayer, J., Giannuzzi, L. A., Kamino, T., and Michael, J., MRS Bull., vol. 32, no. 05, pp. 400–407, 2007, doi: 10.1557/mrs2007.63.CrossRefGoogle Scholar