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Challenges and Results for Quantitative Piezoelectric HysteresisMeasurements by Piezo Force Microscopy

Published online by Cambridge University Press:  30 December 2005

B. D. Huey ,
R. Nath ,
R. E. Garcia  and
J. E. Blendell
B. D. Huey
Affiliation:
Department of Materials Science, University of Connecticut
R. Nath
Affiliation:
Department of Materials Science, University of Connecticut
R. E. Garcia
Affiliation:
Center for Theoretical and Computational Materials Science, National Institute of Standards and Technology, Maryland
J. E. Blendell
Affiliation:
Ceramics Division, National Institute of Standards and Technology, Maryland
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Atomic Force Microscopy (AFM) has become a ubiquitous tool for analyzing the topography of a wide variety of materials, especially as nanoscale features become more significant for both understanding as well as determining materials properties [1]. Many AFM variations have also been developed for measuring surface properties beyond straightforward cartography. In many of these cases, the contrast mechanisms are often either extremely complex, or not well understood, even though the principles are simple. For example, Piezo-Force Microscopy (PFM) is relatively easy to understand and use in a standard lab for measuring electromechanical properties of materials, but care must be taken in order to obtain quantitative results as described below.

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Other
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Microscopy and Microanalysis , Volume 11 , Issue S03 , December 2005 , pp. 6 - 9
Copyright
© 2005 Microscopy Society of America

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