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Calibration of Projector Lens Distortions for Quantitative High-Resolution TEM

Published online by Cambridge University Press:  01 August 2005

F Hue ,
C L Johnson ,
S Lartigue-Korinek ,
G Wang ,
P R Buseck  and
M J Hytch
F Hue
Affiliation:
Centre d'Etudes de Chimie Metallurgique, CNRS, France
C L Johnson
Affiliation:
Brookhaven National Laboratory, Upton, New York
S Lartigue-Korinek
Affiliation:
Centre d'Etudes de Chimie Metallurgique, CNRS, France
G Wang
Affiliation:
Centre d'Etudes de Chimie Metallurgique, CNRS, France
P R Buseck
Affiliation:
Arizona State University
M J Hytch
Affiliation:
Centre d'Etudes de Chimie Metallurgique, CNRS, France

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 552 - 553
Copyright
© 2005 Microscopy Society of America