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Bridging the Pressure Gap in Electron Beam Induced Current Microscopy: Imaging Charge Transport in Metal Oxide Nanowires under Atmospheric Pressures

Published online by Cambridge University Press:  25 July 2016

A. Stevanovic ,
J. Velmurugan ,
F. Yi ,
D. LaVan  and
A. Kolmakov
A. Stevanovic
Affiliation:
Center for Nanoscale Science and Technology, NIST, Gaithersburg, MD 20899 Maryland Nanocenter, University of Maryland, College Park, MD 20742
J. Velmurugan
Affiliation:
Center for Nanoscale Science and Technology, NIST, Gaithersburg, MD 20899 Maryland Nanocenter, University of Maryland, College Park, MD 20742
F. Yi
Affiliation:
Material Measurement Laboratory, NIST, Gaithersburg, MD 20899
D. LaVan
Affiliation:
Material Measurement Laboratory, NIST, Gaithersburg, MD 20899
A. Kolmakov
Affiliation:
Center for Nanoscale Science and Technology, NIST, Gaithersburg, MD 20899

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1292 - 1293
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Stevanovic, A, et al, J. Am. Chem. Soc 134 (2011). p. 324–332.Google Scholar
[2] Stevanovic, A, et al, J. Phys. Chem. C 117 (2013). p. 24189–24195.Google Scholar
[3] Yi, F, et al, J. Microelectromech. S 24 (2015). p. 1185–1192.Google Scholar