Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-28T10:22:20.744Z Has data issue: false hasContentIssue false
  • English
  • Français

Breaking the Rayleigh Limit in Thick Samples with Multi-slice Ptychography

Published online by Cambridge University Press:  01 August 2018

Yi Jiang ,
Zhen Chen ,
Ismail El Baggari ,
Lena F. Kourkoutis ,
Veit Elser  and
David A. Muller
Yi Jiang
Affiliation:
Department of Physics, Cornell University, Ithaca, NY
Zhen Chen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY
Ismail El Baggari
Affiliation:
Department of Physics, Cornell University, Ithaca, NY
Lena F. Kourkoutis
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY
Veit Elser
Affiliation:
Department of Physics, Cornell University, Ithaca, NY
David A. Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 192 - 193
Copyright
© Microscopy Society of America 2018 

References

[1] Tate, M., et al, Microscopy and Microanalysis 22 2016) p. 237.Google Scholar
[2] Jiang, Y., et al arXiv: 1801.04630[cond.Mat].Google Scholar
[3] Maiden, A. M., et al, Journal of the Optical Society of America A 8 2012) p. 1606.Google Scholar
[4] Work supported by DOE (DE-SC0005827) & NSF (DMR-1719875, DMR-1429155, DMR-1539918). NbsCh sample provided by J. P. Sheckelton, C. Pasco, T. M. McQueen (Johns Hopkins University).Google Scholar